• Phone: +33 1 43 34 62 00
    • Fax: +33 1 43 34 63 50
    • 29 Quai des Gresillons , 92622 Gennevilliers, Cedex, France

    World leader in Secondary Ion Mass Spectrometer (SIMS), Electron Probe Microanalysis (EPMA), Low-energy Electron induced X-ray Emission Spectrometry (LEXES), Atom Probe Tomography (APT), Inductively Coupled Plasma Mass Spectrometry (ICP-MS), Glow Discharge Mass Spectrometry (GD-MS) and Thermal Ionisation Mass Spectrometry (TIMS). It provides scientific instrumentation for the international research community and in-fab/near-fab metrology solutions for the semiconductor manufacturing industry. Markets include materials, nuclear, semiconductor, geochemistry, environmental and life sciences.

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