Monday, June 29, 2015

Contact: Nick Maddock+44 (0) 116 276 3771

New AMETEK Taylor Hobson Talysurf i-Series Offered in 1mm, 2mm and 5mm Gauge Ranges

LEICESTER, ENGLAND— A new series of high-resolution instruments offering automated simultaneous surface and contour inspection has been introduced by Taylor Hobson, a unit of AMETEK Ultra Precision Technologies (www.taylor-hobson.com). The low-noise axes and high-resolution gauge of the Talysurf i-Series instruments assure measurement integrity, and a choice of gauge ranges provides versatility for a variety of applications.

The instruments are available in 1mm, 2mm and 5mm gauge ranges with an 18- bit gauge for improved resolution in surface detail, contour and 3D measurement. Powerful software for analysis of surface finish and form is included.

Ultra-precision machining and FEA (Finite Element Analysis) optimized design combine to provide low-noise and high-accuracy mechanical execution of the measuring axes. Balanced beam design allows the instruments to be used in any orientation. Traceable standards and exclusive algorithms effectively eliminate instrument influence from the measurement results.

A unique temperature compensation system monitors and feeds back changes in ambient temperature, ensuring consistent system performance and high measurement integrity, regardless of environmental effects.

Taylor Hobson is a leading manufacturer of ultra-precision measurement instruments for a wide range of markets including optics, semiconductors, manufacturing and nanotechnology research. It is a unit of AMETEK, Inc., a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of $4.2 billion.

For more information on Taylor Hobson’s full line of ultra-precision measurement instruments, contact Taylor Hobson, 2 New Star Road, Leicester, LE4 9JQ, UK. Tel: +44 (0) 116 276 3771. Fax: +44 (0) 116 246 0579. E-mail: sales@taylorhobson.com Web site: www.taylor-hobson.com

Click here for a hi-res image of the Talysurf i-Series Contour and Surface Measurement Instrument