EDAX Introduces Octane SDD Series for Transmission Electron Microscopes

Monday, February 24, 2014

MAHWAH, NJ – EDAX, Inc. a leader in X-ray microanalysis and electron diffraction instrumentation, introduces a new series of detectors for the Transmission Electron Microscope (TEM) into its highly successful Octane Silicon Drift Detector (SDD) family. Based on the state-of-the-art design of the company’s Octane SEM series, the Octane TEM portfolio offers three models to meet the needs of all TEM applications.

The Octane TEM Series offers modules sized from 30 mm2 to 100 mm2 and provides solid angles up to 1.1 steradian. Built with EDAX Smart detector design, the detectors allow optimal geometry inside the TEM column and maximize data collection. With the market’s only on-detector electronics, Octane TEM SDDs can produce resolutions as low as 123 eV and are optimized for low-energy X-ray collection.

Additionally, the Octane TEM detectors are specially designed not to require the typical protective window in front of the module. This windowless system maximizes x-ray collection and greatly improves the effective solid angle.

“The windowless design offers the double benefit of eliminating the absorption of light elements and removing the need for a solid angle-reducing support grid,” comments Mike Coy, Global Marketing Manager for EDAX. “This results in a significant increase in detection efficiency, increasing both light element sensitivity and overall count rates”.

The Octane TEM SDD family is paired with EDAX’s TEAM™ EDS software, allowing users to optimize their analysis time and get the best data possible from their samples. The software is designed with TEM considerations in mind, featuring safety interlocks and automated retraction, to provide the best protection against harmful conditions.
With modern software, market-leading low noise electronics and Smart detector design, the Octane TEM SDDs produce best-in-class efficiency and resolution that turn raw data into materials solutions for EDAX users.

EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of more than $3.6 billion.

For further information about EDAX, contact:
Sue Arnell
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 • Fax: (201) 529-3156
E-mail: info.edax@ametek.com
Website: www.edax.com

Click here for a hi-res image of the Octane SDD Series for TEM.