Nanolab Technologies LEAPS Forward with High-Performance Analysis Services
Nanolab Technologies has purchased a new Local Electrode Atom Probe (LEAP) from CAMECA Instruments to provide advanced materials analysis, including atom-by-atom identification, 3-D spatial positioning and accurate atomic-scale material reconstruction.
Materials Analysis is a leader in advanced laboratory and analytical instruments used by academia, government and industry to conduct elemental analysis, nanotechnology and materials research and to perform onsite quality assurance, analysis and inspection. It also is a leader in ultrahigh-speed digital cameras used in defense, automotive, engineering, research and development, broadcasting and entertainment.
Precitech Vision Research and Levicron Release Slow Motion Videos of Ultra Precision Machining
KEENE, NH, September 18, 2014 – Precitech and Vision Research, both businesses of AMETEK, Inc., have partnered with Levicron, a German manufacturer of air-bearing spindles, to create unique slow-motion videos of ultra precision machining. Together they have released a second series of these videos, allowing viewers to see additional processes in detail not available until now.
Taylor Hobson Launches Talyrond 500H Surface Measurement and Analysis
The new Talyrond 500H precision surface measurement tool from Taylor Hobson, a global leader in ultra-precision measurement instruments, offers such features as an industry-leading high-speed column drive, precision positioning and 4mm roundness and contour gauge.
CAMECA Launches Next Generation Atom Probe Microscope
CAMECA, a world leader in scientific instrumentation and metrology solutions, is pleased to announce the release of its latest generation atom probe microscope. The LEAP 5000 offers unparalleled 3-dimensional nano-scale surface, bulk and interfacial materials analysis with atom-by-atom identification and accurate spatial positioning.
AMETEK Announces Two Acquisitions
AMETEK, Inc. has completed two acquisitions:
• AMPTEK, Inc., a privately held provider of x-ray detectors used to identify the composition of materials using x-ray fluorescence (XRF) within the metal, environmental monitoring, petrochemical, semiconductor and research markets
• Luphos GmbH, a highly strategic technology acquisition which provides key non-contact metrology technology used in the measurement of complex aspherical lenses and optical surfaces
“Both AMPTEK and Luphos are excellent acquisitions and highly strategic additions to our Electronic Instruments Group. These businesses allow us to expand our presence in materials analysis and dimensional metrology, two attractive growth platforms. These acquisitions also continue our very strong deployment of capital on acquisitions,” comments Frank S. Hermance, AMETEK Chairman and Chief Executive Officer.
TMC Names Steffen Roerentrop as European Sales Manager
Peabody, MA, October 6, 2014 —TMC, a unit of AMETEK Ultra Precision Technologies and the world leader in precision floor vibration control, has appointed Steffen Roerentrop as European Sales Manager.
EDAX Launches New Bangalore Demonstration Facility
MAHWAH, NJ – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has opened a new highly equipped demonstration laboratory within AMETEK’s Bangalore, India, sales, service and support center that significantly increases the availability of important materials characterization technologies to scientists and microscopists around the region and across India.
TMC Introduces Stage-Base 450 with Voice Coil Technology
Peabody, MA — TMC, an industry leader in high-performance vibration and motion cancellation technology, has introduced Stage-Base™ 450, its next generation of frame-mountable, active vibration and motion cancellation systems designed to control building floor vibration in semiconductor facilities, while increasing wafer-processing throughput.
CAMECA Helps US Navy LEAP Forward in Marerials Design
The US naval Research Laboratory (NRL) has taken delivery of the US Department of Defense's first Local Electrode Atom Probe (LEAP) microscope to use in advanced materials analysis.